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Exploring Scanning Probe Microscopy with MATHEMATICA
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Click here to buy Exploring Scanning Probe Microscopy with MATHEMATICA by  Dror Sarid. Exploring Scanning Probe Microscopy with MATHEMATICA
by Dror Sarid
Sales Rank: 2029536
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  • Hardcover: 310 pages
  • Publisher: Wiley-VCH; 2 edition March 26, 2007
  • Language: English
  • ISBN-10: 3527406174
  • ISBN-13: 978-3527406173
  • Product Dimensions: 9.6 x 6.8 x 0.9 inches
  • Shipping Weight: 1.8 pounds

    Product Description
    This new and completely updated edition features not only an accompanying CD-ROM, but also a new applications section, reflecting the many breakthroughs in the field over the last few years. It provides a complete set of computational models that describe the physical phenomena associated with scanning tunneling microscopy, atomic force microscopy, and related technologies.

    The result is both a solid professional reference and an advanced-level text, beginning with the basics and moving on to the latest techniques, experiments, and theory. In the section devoted to atomic force microscopy, the author describes the mechanical properties of cantilevers, atomic force microscope tip-sample interactions, and cantilever vibration characteristics. This is followed by an in-depth treatment of theoretical and practical aspects of tunneling phenomena, including metal-insulator-metal tunneling and Fowler-Nordheim field emission. The final section features applications, dealing with, among others, Kelvin and Raman probe microscopy.

    The self-contained presentation spares researchers valuable time spent hunting through the technical literature for the theoretical results required to understand the models presented. The Mathematica code for all the examples is included in the CD-ROM, affording the freedom to change the values and parameters of specific problems as desired, or even modify the programs themselves to suit various modeling needs.

    Publisher Description
    A collection of self-contained, interactive and computational examples from the field of scanning probe microscopy and related technologies using Mathematica notebooks. This book allows users to work with interactive models change the values and parameters of specific problems. --This text refers to an out of print or unavailable edition of this title.

    Customer Reviews & Comments
    This review is from: Exploring Scanning Probe Microscopy with Mathematica (Hardcover) There is a considerable body of theory behind Atomic Force Microscopy/STM. In how it works, and in the modelling of the potential energy at a surface under study. This can be a problem for those who want to use an AFM, and who might perhaps be new to the field. At the modelling level, the book shows the multitude of possible models, and their associated parameters, that can be used. This presents an obstacle. Because typically, you have to start by building those computational model code bodies from scratch, based on guidelines in books or papers. This is especially a problem if you are an experimentalist, where your interests are not necessarily in modelling. Sarid does the reader a huge favour. By offering not just equations, but functional code, implemented in a Mathematica framework, that you can tweak to your delight. Basically, the book and its website give you a computational lab, fully equipped. The book also shows how Mathematica has become indispensible in research, by providing the necessary computational framework.

  • Exploring Scanning Probe Microscopy with MATHEMATICA
    List Price: $200.00
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    Price: $200.00
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